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Department of Commerce

Department of Commerce

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Updated Feb 11, 2026Page 2
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Department of Commerce

CHIPS R&D: Upgrade of In-Line RSoXS through station – Combined Sources Sought/Notice of Intent to Sole Source

BACKGROUND ***THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE*** The National Institute of Standards and Technology (NIST), Materials Measurement Lab is upgrading the resonant soft X-ray scattering (RSoXS) through station at NSLS-II as part of a…

Posted: Feb 11, 2026Due: Feb 11, 2025Closed
Department of Commerce

External Cavity Diode Lasers

Request for Information/Sources Sought Notice for Providers/Suppliers of External Cavity Diode Lasers Notice ID: NB6720202600552 Contract Opportunity Type - Sources Sought Response Date 02/18/2026 Product Service Code 6625—Electrical and Electrical Properties Measuring and Testing Instruments NAICS Code: 334516 – Analytical Laboratory Instrument…

Posted: Feb 11, 2026Due: Feb 18, 2026Closed
Department of Commerce

Ultraviolet Pulsed Laser Head

THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE Announcement Number: NIST-SS26-CHIPS-37 Subject: Notice of Intent to Noncompetitively Acquire UV Pulsed Laser Head This notice is not a request for a quotation. A solicitation document will not…

Posted: Feb 10, 2026Due: Mar 03, 2025Closed
Department of Commerce

WR4 On-Wafer Probes

** Amendment 01: The purpose of Amendment 01 is to provide answers to submitted question(s) from industry. Answers to the industry questions are provided in a document separately attached to this solicitation. All other terms and conditions remain unchanged. ** This is…

Posted: Feb 09, 2026Due: Feb 11, 2026Closed
Department of Commerce

Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Instrument

This National Institute of Standards and Technology (NIST) has a requirement for a Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instrument capable of performing a suite of customized measurements. See attached Solicitation# 1333ND26QNB030053, and associated Attachments 1 (SOW) and 2…

Posted: Feb 09, 2026Due: Feb 23, 2026Due in 1d
Department of Commerce

Sources Sought for Hyperfine Swoop MRI System Software and Maintenance

Project Title: Proprietary Software Support and Maintenance for Hyperfine Swoop MRI System Notice ID: NB686080-26-00568 NAICS Code: 811210 – Electronic and Precision Equipment Repair and Maintenance THIS SOURCES SOUGHT IS NOT A REQUEST FOR QUOTATION. 1. Introduction This is a Sources Sought…

Posted: Feb 06, 2026Due: Feb 13, 2026Closed
Department of Commerce

Combined Sources Sought/Notice of Intent: Digital Lock-in Amplifiers

THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE Announcement Number: NIST-SS26-CHIPS-71 Subject: Notice of Intent to Noncompetitively Acquire Digital Lock-in Amplifiers This notice is not a request for a quotation. A solicitation document will not be…

Posted: Feb 06, 2026Due: Feb 20, 2026Closed

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