Special Notice from ENERGY, DEPARTMENT OF • ENERGY, DEPARTMENT OF. Place of performance: NM. Response deadline: Apr 24, 2026. Industry: NAICS 334517 • PSC 6635.
Awarded-market signal for NAICS 334517 (last 12 months), benchmarked to sector 33.
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This technology, Industrial Lens-Coupled Radiography, enables clearer, faster and more reliable X-ray inspection of large, dense metal parts by redesigning how high-energy X-rays are captured and converted into digital images. Unlike conventional medical-style detectors that struggle with thick or 3D-printed components, this system from Los Alamos National Laboratory uses a more efficient light-collection approach to dramatically improve image quality and inspection speed at megavoltage energies. The result is scalable, high-resolution CT imaging capable of detecting sub-millimeter defects inside complex industrial parts — helping aerospace, defense, energy and advanced manufacturing companies ensure safety, reduce scrap and increase production throughput.
How it Works:
Industrial Lens-Coupled Radiography operates by first converting incoming high-energy X-rays into visible light within a scintillator designed for megavoltage conditions. That light is then optically relayed to a digital flat-panel imaging sensor, rather than being directly attached in the traditional medical configuration. This optical architecture allows the X-ray conversion stage and the digital detector to be optimized independently for high-energy industrial use. The system captures calibrated reference images alongside inspection images, and software processing corrects for detector and beam variations to produce a uniform, high-fidelity final image suitable for radiography or computed tomography workflows.
Technical Overview:
Industrial Lens-Coupled Radiography is engineered for megavoltage (≥1 MeV) industrial X-ray systems and is optimized specifically for high-energy radiography and computed tomography applications. The architecture separates the X-ray conversion stage from the digital detection stage using optical coupling, allowing each to be independently optimized for efficiency, format size and durability under high-energy conditions. The system supports scalable, large-area detector configurations suitable for high-magnification inspection geometries and integration with commercial flat-panel sensors and industrial microfocus X-ray sources. A structured calibration and correction framework compensates for detector bias and beam non-uniformity, enabling consistent, high-fidelity image reconstruction within standard industrial CT workflows.
Key Advantages:
Market Applications:
Development Status: TRL 3
US Patent pending, S-167667.001
LA-UR-26-22770
LANL Tech Partnerships: Unlock the Innovative Potential
Los Alamos National Laboratory offers a wide range of cutting-edge technologies and capabilities that may provide your company with a competitive edge in the market and unlock the innovative potential that can enhance, refine, and revolutionize your products.
LANL’s licensing program focuses on moving inventions developed by our researchers to commercial innovations. Patented and patent pending inventions and copyrighted software are available to existing and start-up companies through exclusive and non-exclusive licensing agreements. For specific discussions, please contact licensing@lanl.gov.
Note: This is not a call for external services for the development of this technology.
https://www.lanl.gov/engage/collaboration/feynman-center/partner-with-us/licensing-technology
m.lanl.gov/tech-search
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